Gyulai József & Láng János. (1960). Measurement of diffusivity, lifetime and surface recombination velocity in semiconductors by the flying spot method.
Chicago Style (17th ed.) CitationGyulai József and Láng János. Measurement of Diffusivity, Lifetime and Surface Recombination Velocity in Semiconductors by the Flying Spot Method. 1960.
MLA idézésGyulai József and Láng János. Measurement of Diffusivity, Lifetime and Surface Recombination Velocity in Semiconductors by the Flying Spot Method. 1960.
Figyelem: ezek az hivatkozások nem 100%-ban pontosak..